Home » Emerging Technologies » 2-micron CO2 DIAL Profling System
2-micron CO2 DIAL Profling System
STATUS
Research Prototype
AVAILABILITY
Starting in the fall of 2008 after completion of development. A comprehensive testing and evaluation is planned in the summer of 2008. http://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/20080023792_2008023448.pdf http://esto.nasa.gov/conferences/ESTC2006/papers/b9p3.pdf
REQUEST PROCEDURE
E-mail or letter request.
Emerging Technologies
A ground-based CO2 DIAL profiling system is currently near the end of second year of a three year development plan. This is funded by NASA ESTO. It uses 100 mJ energy double pulsed Ho:Tm:YLF laser locked to a CO2 absorption line and operating from a side-line position, a hetero-junction phototransistor, a 16" all metal telescope, and 24-bit 2-channel PXI-5922 digitizer. The expected CO2 profiling capability is from the boundary layer to 5 km, with 0.5-1.0 km resolution and 1-2 ppm precision.
CONTACT
Syed Ismail
NASA Langley Research Center
MS 401A NASA Langley Research center Hampton, VA 23681
757-864-2719
syed.Ismail-1@nasa.gov
http://esto.nasa.gov/conferences/ESTC2006/papers/b9p3.pdf
SPECIFICATIONS
DeveloperSyed Ismail
Development SectorFed/State Gov
R&D ProgramYes
Years Till Available<3
Investment RequiredN/A
Projected ApplicationOCO validation, Carbon Cycle field experiments
Unit Cost$1-10M
Key RisksLaser and detectors.
Ease of Usesingle operator
PlatformsGround
TRLTRL 4
REFERENCES
'Design, development, and validation of a high sensitivity DIAL system for profiling atmospheric CO2' by S. Ismail, G. j. Koch, M. N. abedin et al., Proce. 23rd Int. Laser Radar conf., C. Nagasawa and N. Sugimoto (Eds) PART I, PP 349-352, Nara, Japan, 24-28 July 2006.
REMARKS
The system has completed field testing in July 2008 for boundary layer CO2 measurements
UPDATED ON
2 Oct 2009 17:38